Date of dispatch of this notice: 01/08/2018
Expire date: 17/08/2018
External Reference: 2018-108286
TED Reference: 2018/S 149-340670
Contract notice
Information
Published
Contract notice
[NoticeContract]
[Directive201424]
[Section1]: [Ca]
I.1)
[NameAddressContact]
Education Procurement Service (EPS)
IE 6609370 G
University of Limerick, Plassey
Limerick
Co.Limerick
IE
[Contactpoint]:
Marissa Staunton
[AddressPhone]:
+353 61234238
[AddressEmail]:
marissa.staunton@ul.ie
[Nutscode]:
IE0 -
IRELAND
[UrlGeneral]:
www.etenders.gov.ie
[UrlBuyerprofile]:
https://irl.eu-supply.com/ctm/Company/CompanyInformation/Index/87073
I.2)
[JointProcurement]
[JointProcurementCentral]
I.3)
[InfoTendering]
[AddressObtainDocs]:
http://irl.eu-supply.com/app/rfq/rwlentrance_s.asp?PID=133142&B=ETENDERS_SIMPLE[AddressFurtherinfo]
[AsContactsAbove]:
[AddressSendTendersRequest]
[AddressSendTenders]:
http://irl.eu-supply.com/app/rfq/rwlentrance_s.asp?PID=133142&B=ETENDERS_SIMPLE
[AddressSendTendersRequest]
[AddressToAbove]
I.4)
[CaType]
[MaintypeMinistry]
I.5)
[Mainactivity]
[MainactivEducation]
[Section2]: [Object]
II.1)
[QuantityScopeContract]
II.1.1)
[TitleContract]
LEE493C - Supply of an Atomic Force Microscope to Maynooth University
[Fileref]:
LEE493C
II.1.2)
[CpvMain]
38510000
-
II.1.3)
[TypeContract]
[Supplies]
II.1.4)
[DescrShort]
Dear Suppliers,
An Atomic Force Microscope (AFM) capable of performing rapid 2D and 3D imaging of a sample area is required The instrument should have scanning and analysis options, reduced noise and sample analysis capabilities as laid out in the requirements tables of the attached documents.
This instrument will be used for topological characterization of a variety of biomaterials; primarily DNA nanostructure but also DNA-protein structures, proteins and RNA nanostructures. The instrument should allow for the rapid taking of large amounts of data (large scan areas at high resolution) as well as detailed characterisation of nanostructures.
An Atomic Force Microscope (AFM) capable of performing rapid 2D and 3D imaging of a sample area is required The instrument should have scanning and analysis options, reduced noise and sample analysis capabilities as laid out in the requirements tables of the attached documents.
This instrument will be used for topological characterization of a variety of biomaterials; primarily DNA nanostructure but also DNA-protein structures, proteins and RNA nanostructures. The instrument should allow for the rapid taking of large amounts of data (large scan areas at high resolution) as well as detailed characterisation of nanostructures.
II.1.6)
[LotsInfo]
[DivisionLots]:
[No]
II.2)
[Description]
II.2.2)
[CpvAdditional]
33000000
-
38000000
-
38512000
-
38512200
-
38600000
-
II.2.3)
[PlacePerformance]
[Nutscode]:
IE -
IRELAND
[MainsiteplaceWorksDelivery]:
Maynooth University
II.2.4)
[DescrProcurement]
Dear Suppliers,
An Atomic Force Microscope (AFM) capable of performing rapid 2D and 3D imaging of a sample area is required The instrument should have scanning and analysis options, reduced noise and sample analysis capabilities as laid out in the requirements tables of the attached documents.
This instrument will be used for topological characterization of a variety of biomaterials; primarily DNA nanostructure but also DNA-protein structures, proteins and RNA nanostructures. The instrument should allow for the rapid taking of large amounts of data (large scan areas at high resolution) as well as detailed characterisation of nanostructures.
An Atomic Force Microscope (AFM) capable of performing rapid 2D and 3D imaging of a sample area is required The instrument should have scanning and analysis options, reduced noise and sample analysis capabilities as laid out in the requirements tables of the attached documents.
This instrument will be used for topological characterization of a variety of biomaterials; primarily DNA nanostructure but also DNA-protein structures, proteins and RNA nanostructures. The instrument should allow for the rapid taking of large amounts of data (large scan areas at high resolution) as well as detailed characterisation of nanostructures.
II.2.5)
[AwardCriteria]
[AwardCriteriaDescriptive]
II.2.7)
[DurationContractFrameworkDps]
[DurationMonths]:
60
[RenewalsSubject]:
[No]
II.2.10)
[VariantsInfo]
[VariantsAccepted]:
[No]
II.2.11)
[OptionsInfo]
[Options]:
[No]
II.2.13)
[EuProgrInfo]
[EuProgrRelated]:
[Yes]
[EuProgrRef]:
ERC Consolidator award
II.2.14)
[InfoAdditional]
Dear Suppliers,
An Atomic Force Microscope (AFM) capable of
performing rapid 2D and 3D imaging of a sample
area is required The instrument should have
scanning and analysis options, reduced noise and
sample analysis capabilities as laid out in the
requirements tables of this document.
Kind Regards,
EPS Team
An Atomic Force Microscope (AFM) capable of
performing rapid 2D and 3D imaging of a sample
area is required The instrument should have
scanning and analysis options, reduced noise and
sample analysis capabilities as laid out in the
requirements tables of this document.
Kind Regards,
EPS Team
[Section3]: [InfoLegal]
III.1)
[ConditionsParticip]
III.1.2)
[EconomicFinancialStanding]
[CriteriaSelectionDocs]
III.1.3)
[TechnicalCapacity]
[CriteriaSelectionDocs]
III.2)
[ConditionsContract]
[Section4]: [Procedure]
IV.1)
[Description]
IV.1.1)
[TypeProcedure]
[ProctypeOpen]
[ProctypeAccelerated]
[Justification]:
Due to the exigent nature of this requirement, resultant of funding deadlines, an accelerated procedure has been selected.
IV.1.8)
[GpaInfo]
[GpaCovered]
: [Yes]
IV.2)
[InfoAdmin]
IV.2.2)
[LimitReceiptTendersReqPart]
[Date]:
17/08/2018
[Time]:
14:00
IV.2.4)
[LanguagesAllowed]
[Language_EN]
IV.2.6)
[MinTimeMaintain]
[DurationMonths]
: 60
([FromStatedDate])
IV.2.7)
[OpeningConditions]
[Date]:
17/08/2018
[Time]:
14:00
[Section6]: [InfoComplement]
VI.1)
[RecurrenceInfo]
[RecurrentProcurement]:
[No]
VI.4)
[AppealsProcedure]
VI.4.1)
[AppealsBody]
High Court
Dublin
IE
IE