LEE935C - AIT - Provision of a Scanning Thermal Microscope with Nano Thermal analysis capabilities

Tenders are sought for the supply, delivery & installation of a Scanning Thermal Microscope with Nano Thermal analysis capabilities. The system must be based on an atomic force microscope (AFM) where the AFM must be supplied with a module or modules that combine the high spatial resolution imaging capabilities of atomic force microscopy with the ability to obtain an understanding of the thermal behaviour of materials with a spatial resolution of sub-100 nm. One capability must specifically provide nanoscale temperature and thermal conductivity measurements whilst simultaneously obtaining topography. The set-up must have the ability to visualise the surface at nanoscale resolution with the AFM’s routine imaging modes and enable the user to select the spatial locations at which they will investigate the thermal properties of the surface by applying heat locally via the probe tip and measuring the thermomechanical response. The system must have calibration capabilities in order to provide results in degrees Celsius. This calibration procedure should also take into account any parasitic thermally-induced cantilever bending. An Enclosure and Vibration Isolation table must also be provided with this unit.

Supplies

12/10/2020 14:00:00

38000000-5  Laboratory, optical and precision equipments (excl. glasses)
38510000-3  Microscopes
38511000-0  Electron microscopes
38511100-1  Scanning electron microscopes
38511200-2  Transmission electron microscope
38512000-7  Ion and molecular microscopes
38512100-8  Ion microscopes
38514200-3  Scanning probe microscopes
38515000-8  Fluorescent and polarising microscopes
38515100-9  Polarising microscopes
38515200-0  Fluorescent microscopes
38634000-8  Optical microscopes