II.1)
Scope of the procurement
Request for Tenders under Open (OJEU) Procedure for the Supply, Delivery and Installation of a Broad Ion Beam Milling System for SP&S for the Tyndall National Institute, UCC
Reference number:
UCC/2022/02
39300000
-
Miscellaneous equipment
Supplies
II.1.4)
Short description
The Specialty Products & Services Group (SP&S) at Tyndall National Institute, UCC, fabricate a wide variety of Semiconductor devices, ranging from traditional Silicon microelectronics and Silicon MEMS to III-V photonic devices. In addition, SP&S provide an extensive array of analysis services in all types of electronic devices and packages to internal and external customers. The Electron Microscopy and Analysis Facility (EMAF) within SP&S utilise a wide range of SEM, TEM and FIB equipment as part of these analysis services. We wish to extend our capability in the area of sample preparation by purchasing a fully functional Broad Ion Beam (BIB) milling system with an ancillary mechanical polishing system which will allow us to bridge a sample cross-section preparation gap between our existing plasma FIB and mechanical methods
II.1.5)
Estimated total value
Value excluding VAT: 220000.00
EUR
II.1.6)
Information about lots
This contract is divided into lots:
no
II.2.2)
Additional CPV code(s)
38000000
-
Laboratory, optical and precision equipments (excl. glasses)
73110000
-
Research services
73111000
-
Research laboratory services
II.2.3)
Place of performance
NUTS code:
IE053 -
South-West
Main site or place of performance:
Tyndall National Institute, University College Cork
II.2.4)
Description of the procurement
The Specialty Products & Services Group (SP&S) at Tyndall National Institute, UCC, fabricate a wide variety of Semiconductor devices, ranging from traditional Silicon microelectronics and Silicon MEMS to III-V photonic devices. In addition, SP&S provide an extensive array of analysis services in all types of electronic devices and packages to internal and external customers. The Electron Microscopy and Analysis Facility (EMAF) within SP&S utilise a wide range of SEM, TEM and FIB equipment as part of these analysis services. We wish to extend our capability in the area of sample preparation by purchasing a fully functional Broad Ion Beam (BIB) milling system with an ancillary mechanical polishing system which will allow us to bridge a sample cross-section preparation gap between our existing plasma FIB and mechanical methods
Criteria below
Quality criterion
-
Name:
Technical Merit of Offering
/
Weighting:
30%
Quality criterion
-
Name:
Technical Support & Maintenance
/
Weighting:
15%
Quality criterion
-
Name:
Energy & Environmental Requirement
/
Weighting:
10%
Quality criterion
-
Name:
Strategic Agreement
/
Weighting:
5%
Quality criterion
-
Name:
Sample Assessment
/
Weighting:
10%
Cost criterion
-
Name:
Ultimate Cost
/
Weighting:
30%
Value excluding VAT: 220000.00
EUR
II.2.7)
Duration of the contract, framework agreement or dynamic purchasing system
Duration in months:
24
This contract is subject to renewal:
no
II.2.10)
Information about variants
Variants will be accepted:
yes
II.2.11)
Information about options
Options:
yes
Description of options:
RFT allows for additional components to be purchased at a later date subject to budget availability and research needs.
II.2.13)
Information about European Union funds
The procurement is related to a project and/or programme financed by European Union funds:
yes
Identification of the project:
SFI
II.2.14)
Additional information