LEE638C - TCD - RFT for new Analyser, X-ray Source and Argon Gun for an existing XPS System (ESCALAB MK II)

An x-ray source, analyser and argon gun to be used in an XPS System (ESCALAB MK II). This will enable SFI funded, materials science research in AMBER CRANN at Trinity College Dublin. The XPS technique is unique as it allows highly surface sensitive analysis of broad range of materials. Specifically, the research carried out will be in characterising the surface chemistry of materials. XPS can be used to measure elemental composition, chemical and electronic states, empirical formula of the elements within a material. This is achieved by irradiating the surface using an x-ray source while simultaneously measuring the kinetic energy of the electrons emitted from the sample using an electron analyser. Due to the surface sensitive nature of the technique, an in-situ surface clean is achieved by exposing the sample surface to argon ions generated by an argon gun. Research areas include development of next generation electronics, drug development, photovoltaics and catalysis.

Supplies

07/05/2019 16:00:00

38000000-5  Laboratory, optical and precision equipments (excl. glasses)
33111000-1  X-ray devices
33114000-2  Spectroscopy devices
35312000-4  Gas guns
38433000-9  Spectrometers
38433100-0  Mass spectrometer
38434000-6  Analysers
38434510-4  Cytometers
38434560-9  Chemistry analyser
38500000-0  Checking and testing apparatus
38580000-4  Non-medical equipment based on the use of radiations
38582000-8  X-ray inspection equipment
38900000-4  Miscellaneous evaluation or testing instruments
38947000-7  X-ray microanalysers